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MicroPhysics
Flying Height Tester
MicroPhysics
provides a fully-supported flying height tester with patent-pending phase-based
measurement to allow rapid flying height test at flying heights below 10 nm.
Please
click on the "FHT Linearity" link above for some technical
information.
Specifications subject
to change without notice or obligation.
Copyright © 1999-2020 MicroPhysics, Inc. All Rights Reserved.
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Guzik
Spinstand Helium/Altitude Chamber
Flying
Height
Tester
Altitude
Simulation Chamber
Dynamic
Protrusion Tester
Tape
Head Tester
Tape
Spacing Analyzer
SliderLab
TapeLabH
TapeLab
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